Journal papers

Biblio logo(2) Distance metric learning with the Universum
B. Nguyen, C. Morell and B. De Baets
(2017) PATTERN RECOGNITION LETTERS. 100, 37-43.
Biblio logo(1) Supervised distance metric learning through maximization of the Jeffrey divergence
B. Nguyen, C. Morell and B. De Baets
(2017) PATTERN RECOGNITION. 64, 215-225.